TMM Thin-Film Reflectance Simulator

Compute reflectance and transmittance of an arbitrary multilayer optical stack using the characteristic-matrix (transfer-matrix) method.

Design and analyse multilayer thin-film coatings with full Transfer Matrix Method physics. Build stacks from the Kriya materials library or enter custom refractive indices. Compute R, T, and A spectra over wavelength and angle. Visualise reflected colour under D65 illumination. Export results for further analysis.