Coating Stack Designer
Design multi-layer anti-reflective coating stacks using Kriya's PFAS-free nanoparticle platform. See live reflectance and transmittance spectra computed via the Transfer Matrix Method.
Preset configurations
Substrate
Coating layers(top to bottom)
Add layer:
Stack cross-section
Reflectance spectrum (TMM)
Transmittance spectrum
Methodology
Full Transfer Matrix Method (TMM) at normal incidence. Each layer contributes a 2×2 characteristic matrix M with phase thickness δ = 2πnd/λ. The total system matrix is the ordered product of all layer matrices. Reflectance R = |r|² is extracted from the Fresnel reflection coefficient. Substrate dispersion follows the Cauchy model: n(λ) = A + B/λ² + C/λ⁴. Non-absorbing dielectric approximation (T = 1 − R). Photopic-weighted averaging uses the CIE V(λ) luminosity function.
Model limitations
- —Coating RIs are nominal values at 550 nm. Real Cauchy dispersion coefficients available from Kriya.
- —Normal incidence only (θ = 0°). For oblique-incidence AR design, use the TMM Simulator.
- —Non-absorbing dielectric model (k=0). UV absorption near band edge not captured.
- —Substrate dispersion uses Cauchy model; coating layers use constant RI.
For production-critical calculations, contact Kriya Materials with your specific requirements. We provide measured optical data and validated simulation support.