Coating Stack Designer

Design multi-layer anti-reflective coating stacks using Kriya's PFAS-free nanoparticle platform. See live reflectance and transmittance spectra computed via the Transfer Matrix Method.

Preset configurations

Substrate

Polymer RI varies with crystallinity, draw ratio, and wavelength (e.g. PET 1.57–1.66, PC 1.58–1.59). Defaults shown are Kriya consensus values for typical semicrystalline grades. Use Custom to enter your own measured n.

Coating layers(top to bottom)

1. LRI
2. HRI

Add layer:

Stack cross-section

Air (n=1.00)LRI n=1.25 110nmHRI n=1.80 15nmGlass (BK7) n=1.52
Avg. reflection (380–780 nm)0.33%
VLT99.7%
Min. R0.036%@ 490 nm
Reflected colour

Reflectance spectrum (TMM)

0%1%2%3%4%400500550600700Wavelength (nm)Reflectance (%)

Transmittance spectrum

96%97%98%99%100%Wavelength (nm)Transmittance (%)

Methodology

Full Transfer Matrix Method (TMM) at normal incidence. Each layer contributes a 2×2 characteristic matrix M with phase thickness δ = 2πnd/λ. The total system matrix is the ordered product of all layer matrices. Reflectance R = |r|² is extracted from the Fresnel reflection coefficient. Substrate dispersion follows the Cauchy model: n(λ) = A + B/λ² + C/λ⁴. Non-absorbing dielectric approximation (T = 1 − R). Photopic-weighted averaging uses the CIE V(λ) luminosity function.

Model limitations

  • —Coating RIs are nominal values at 550 nm. Real Cauchy dispersion coefficients available from Kriya.
  • —Normal incidence only (θ = 0°). For oblique-incidence AR design, use the TMM Simulator.
  • —Non-absorbing dielectric model (k=0). UV absorption near band edge not captured.
  • —Substrate dispersion uses Cauchy model; coating layers use constant RI.

For production-critical calculations, contact Kriya Materials with your specific requirements. We provide measured optical data and validated simulation support.